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1

Ultralow leakage characteristics of ultrathin gate oxides (~3 nm) prepared by anodization followed by high-temperature annealing

Chieh-Chih Ting, Yen-Hao Shih, Jenn-Gwo Hwu

Journal:

IEEE Transactions on Electron Devices

Year:

2002

Language:

english

File:

PDF, 1.27 MB

english, 2002

2

[IEEE 2012 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2012.12.10-2012.12.13)] 2012 International Electron Devices Meeting - A highly scalable 8-layer Vertical Gate 3D NAND with split-page bit line layout and efficient binary-sum MiLC (Minimal Incremental Layer Cost) staircase contacts

Chen, Shih-Hung, Lue, Hang-Ting, Shih, Yen-Hao, Chen, Chieh-Fang, Hsu, Tzu-Hsuan, Chen, Yan-Ru, Hsiao, Yi-Hsuan, Huang, Shih-Cheng, Chang, Kuo-Pin, Hsieh, Chih-Chang, Lee, Guan-Ru, Chuang, Alfred-Tung

Year:

2012

Language:

english

File:

PDF, 2.43 MB

english, 2012

3

[IEEE 2012 4th IEEE International Memory Workshop (IMW) - Milan (2012.05.20-2012.05.23)] 2012 4th IEEE International Memory Workshop - Memory Architecture of 3D Vertical Gate (3DVG) NAND Flash Using Plural Island-Gate SSL Decoding Method and Study of it's Program Inhibit Characteristics

Kuo-Pin Chang,, Hang-Ting Lue,, Chih-Ping Chen,, Chieh-Fang Chen,, Yan-Ru Chen,, Yi-Hsuan Hsiao,, Chih-Chang Hsieh,, Yen-Hao Shih,, Tahone Yang,, Kuang-Chao Chen,, Chun-Hsiung Hung,, Chih-Y

Year:

2012

Language:

english

File:

PDF, 549 KB

english, 2012

4

Improved Reliability Performances of SONOS-Type Devices Using Hot-Hole Erase Method by Novel Negative FN Operations

Yi-Hsuan Hsiao,, Hang-Ting Lue,, Yen-Hao Shih,, Erh-Kun Lai,, Kuang-Yeu Hsieh,, Liu, R., Chih-Yuan Lu,

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2008

Language:

english

File:

PDF, 822 KB

english, 2008

5

Postoperative recovery after anesthesia in morbidly obese patients: a systematic review and meta-analysis of randomized controlled trials

Liu, Feng-Lin, Cherng, Yih-Giun, Chen, Shin-Yan, Su, Yen-Hao, Huang, Shih-Yu, Lo, Po-Han, Lee, Yen-Ying, Tam, Ka-Wai

Journal:

Canadian Journal of Anesthesia/Journal canadien d'anesthésie

Year:

2015

Language:

english

File:

PDF, 1.21 MB

english, 2015

6

A New String Decoding Scheme for Enhancing Array Block Efficiency of Vertical Gate Type (VG-Type) 3-D NAND

Yeh, Teng-Hao, Wu, Chen-Jun, Hu, Chih-Wei, Chen, Wei-Chen, Lue, Hang-Ting, Shih, Yen-Hao, King, Ya-Chin, Lu, Chih-Yuan

Journal:

IEEE Electron Device Letters

Year:

2015

Language:

english

File:

PDF, 961 KB

english, 2015

7

Z-Interference and Z-Disturbance in Vertical Gate-Type 3-D NAND

Yeh, Teng-Hao Elton, Chen, Wei-Chen, Hsu, Tzu-Hsuan Bruce, Du, Pei-Ying Penny, Hsieh, Chih-Chang, Lue, Hang-Ting, Shih, Yen-Hao, King, Ya-Chin, Lu, Chih-Yuan

Journal:

IEEE Transactions on Electron Devices

Year:

2016

Language:

english

File:

PDF, 3.14 MB

english, 2016

8

Phase change materials and their application to random access memory technology

Simone Raoux, Robert M. Shelby, Jean Jordan-Sweet, Becky Munoz, Martin Salinga, Yi-Chou Chen, Yen-Hao Shih, Erh-Kun Lai, Ming-Hsiu Lee

Journal:

Microelectronic Engineering

Year:

2008

Language:

english

File:

PDF, 305 KB

english, 2008

9

High sensitive and wide detecting range MOS tunneling temperature sensors for on-chip temperature detection

Yen-Hao Shih, Shian-Ru Lin, Tsung-Miau Wang, Jenn-Gwo Hwu

Journal:

IEEE Transactions on Electron Devices

Year:

2004

Language:

english

File:

PDF, 508 KB

english, 2004

10

Modeling and Characterization of Hydrogen-Induced Charge Loss in Nitride-Trapping Memory

Yi-Lin Yang, Chia-Hua Chang, Yen-Hao Shih, Kuang-Yeu Hsieh, Jenn-Gwo Hwu

Journal:

IEEE Transactions on Electron Devices

Year:

2007

Language:

english

File:

PDF, 431 KB

english, 2007

11

Inhibition by amphetamine of testosterone secretion through a mechanism involving an increase of cyclic AMP production in rat testes

Shiow-Chwen Tsai, Yu-Chung Chiao, Chien-Chen Lu, Ming-Luen Doong, Yen-Hao Chen, Hsi-Chang Shih, Charlie Liaw, Shyi-Wu Wang, Paulus S. Wang

Journal:

British Journal of Pharmacology

Year:

1996

Language:

english

File:

PDF, 926 KB

english, 1996

12

Particle chain display – an optofluidic electronic paper

Fan, Shih-Kang, Chiu, Cheng-Pu, Hsu, Ching-Hsiang, Chen, Shih-Chiang, Huang, Li-Lin, Lin, Yen-Hao, Fang, Wei-Feng, Chen, Jem-Kun, Yang, Jing-Tang

Journal:

Year:

2012

Language:

english

File:

PDF, 4.00 MB

english, 2012

13

Fluorinated thienyl-quinoxaline-based D–π–A-type copolymer toward efficient polymer solar cells: synthesis, characterization, and photovoltaic properties

Chen, Hsieh-Chih, Chen, Ying-Hsiao, Liu, Chung-Hao, Hsu, Yen-Hao, Chien, Yun-Chen, Chuang, Wei-Ti, Cheng, Chih-Yang, Liu, Chien-Liang, Chou, Shang-Wei, Tung, Shih-Huang, Chou, Pi-Tai

Journal:

Polymer Chemistry

Year:

2013

Language:

english

File:

PDF, 487 KB

english, 2013

14

Modeling the Impact of Random Grain Boundary Traps on the Electrical Behavior of Vertical Gate 3-D NAND Flash Memory Devices

Hsiao, Yi-Hsuan, Lue, Hang-Ting, Chen, Wei-Chen, Chang, Kuo-Pin, Shih, Yen-Hao, Tsui, Bing-Yue, Hsieh, Kuang-Yeu, Lu, Chih-Yuan

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 2.66 MB

english, 2014

15

Locked ortho - and para -Core Chromophores of Green Fluorescent Protein; Dramatic Emission Enhancement via Structural Constraint

Hsu, Yen-Hao, Chen, Yi-An, Tseng, Huan-Wei, Zhang, Zhiyun, Shen, Jiun-Yi, Chuang, Wei-Ti, Lin, Tzu-Chieh, Lee, Chun-Shu, Hung, Wen-Yi, Hong, Bor-Cherng, Liu, Shih-Hung, Chou, Pi-Tai

Journal:

Journal of the American Chemical Society

Year:

2014

Language:

english

File:

PDF, 998 KB

english, 2014

16

[IEEE 2009 IEEE International Reliability Physics Symposium (IRPS) - Montreal, QC, Canada (2009.04.26-2009.04.30)] 2009 IEEE International Reliability Physics Symposium - Study of localized tunnel oxide degradation after hot carrier stressing using a novel mid-bandgap voltage characterization method

Tsai, Cheng-Hung, Shih, Yen-Hao, Hsiao, Yi-Hsuan, Hsu, Tzu-Hsuan, Hsieh, Kuang Yeu, Liu, Rich, Lu, Chih-Yuan

Year:

2009

Language:

english

File:

PDF, 511 KB

english, 2009

17

[IEEE 2012 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2012.12.10-2012.12.13)] 2012 International Electron Devices Meeting - Radically extending the cycling endurance of Flash memory (to > 100M Cycles) by using built-in thermal annealing to self-heal the stress-induced damage

Lue, Hang-Ting, Du, Pei-Ying, Chen, Chih-Ping, Chen, Wei-Chen, Hsieh, Chih-Chang, Hsiao, Yi-Hsuan, Shih, Yen-Hao, Lu, Chih-Yuan

Year:

2012

Language:

english

File:

PDF, 1.41 MB

english, 2012

18

[IEEE 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. - San Jose, CA, USA (April 17-21, 2005)] 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. - Novel soft erase and re-fill methods for a P/sup +/-poly gate nitride trapping non-volatile memory device with excellent endurance and retention properties

Hang-Ting Lue,, Yen-Hao Shih,, Kuang Yen Hsieh,, Liu, R., Chih-Yuan Lu,

Year:

2005

Language:

english

File:

PDF, 1.17 MB

english, 2005

19

[IEEE 2012 e-Manufacturing & Design Collaboration Symposium (eMDC) - HsinChu, Taiwan (2012.09.4-2012.09.4)] 2012 e-Manufacturing & Design Collaboration Symposium (eMDC) - The application of e beam inspection on 3D NAND flash

Liao, Hsiang-Chou, Chen, Yi-Chin, Lee, Guan-Ru, Shih, Yen-Hao, Lue, Hang-Ting, Luoh, Tuung, Yang, Ling-Wu, Hsieh, Kuang-Yeu, Yang, Tahone, Chen, Kuang-Chao, Liu, Rich, Lu, Chih-Yuan

Year:

2012

Language:

english

File:

PDF, 306 KB

english, 2012

20

An on-chip temperature sensor by utilizing a MOS tunneling diode

Yen-Hao Shih,, Jenn-Gwo Hwu,

Journal:

IEEE Electron Device Letters

Year:

2001

Language:

english

File:

PDF, 72 KB

english, 2001

21

[IEEE 2013 IEEE International Electron Devices Meeting (IEDM) - Washington, DC, USA (2013.12.9-2013.12.11)] 2013 IEEE International Electron Devices Meeting - A novel dual-channel 3D NAND flash featuring both N-channel and P-channel NAND characteristics for bit-alterable Flash memory and a new opportunity in sensing the stored charge in the WL space

Lue, Hang-Ting, Du, Pei-Ying, Chen, Wei-Chen, Yeh, Ten-Hao, Chang, Kuo-Ping, Hsiao, Yi-Hsuan, Shih, Yen-Hao, Hung, Chun-Hsiung, Lu, Chih-Yuan

Year:

2013

Language:

english

File:

PDF, 1.83 MB

english, 2013

22

[IEEE 2012 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2012.12.10-2012.12.13)] 2012 International Electron Devices Meeting - Modeling the variability caused by random grain boundary and trap-location induced asymmetrical read behavior for a tight-pitch vertical gate 3D NAND Flash memory using double-gate thin-film transistor (TFT) device

Hsiao, Yi-Hsuan, Lue, Hang-Ting, Chen, Wei-Chen, Chen, Chih-Ping, Chang, Kuo-Ping, Shih, Yen-Hao, Tsui, Bing-Yue, Lu, Chih-Yuan

Year:

2012

Language:

english

File:

PDF, 1.05 MB

english, 2012

23

[IEEE 2013 5th IEEE International Memory Workshop (IMW) - Monterey, CA, USA (2013.05.26-2013.05.29)] 2013 5th IEEE International Memory Workshop - Study of hot-electron assisted programming for split-page 3D vertical gate (VG) NAND flash

Chang, Kuo-Pin, Lue, Hang-Ting, Chang, Chih-Shen, Yeh, Wen-Wei, Hsieh, Chih-Chang, Hsiao, Yi-Hsuan, Shih, Yen-Hao, Lu, Chih-Yuan

Year:

2013

Language:

english

File:

PDF, 821 KB

english, 2013

24

Improvement in the electrical properties of thin gate oxides by chemical-assisted electron stressing followed by annealing (CAESA)

Yen-Hao Shih,, Jenn-Gwo Hwu,

Journal:

IEEE Electron Device Letters

Year:

1999

Language:

english

File:

PDF, 46 KB

english, 1999

25

[IEEE 2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology (ICSICT) - Xian, China (2012.10.29-2012.11.1)] 2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology - Overview of 3D NAND Flash and progress of vertical gate (VG) architecture

Lue, Hang-Ting, Chen, Shih-Hung, Shih, Yen-Hao, Hsieh, Kuang-Yeu, Lu, Chih-Yuan

Year:

2012

Language:

english

File:

PDF, 1.47 MB

english, 2012

26

[IEEE 2006 IEEE International Reliability Physics Symposium Proceedings - San Jose, CA, USA (2006.03.26-2006.03.30)] 2006 IEEE International Reliability Physics Symposium Proceedings - Study of Charge Loss Mechanism of SONOS-Type Devices using Hot-Hole Erase and Methods to Improve the Charge Retention

Lue, Hang-ting, Hsiao, Yi-hsuan, Shih, Yen-hao, Lai, Erh-kun, Hsieh, Kuang-yeu, Liu, Rich, Lu, Chih-yuan

Year:

2006

Language:

english

File:

PDF, 297 KB

english, 2006

27

[IEEE 2012 IEEE Symposium on VLSI Technology - Honolulu, HI, USA (2012.06.12-2012.06.14)] 2012 Symposium on VLSI Technology (VLSIT) - A highly pitch scalable 3D vertical gate (VG) NAND flash decoded by a novel self-aligned independently controlled double gate (IDG) string select transistor (SSL)

Chen, Chih-Ping, Lue, Hang-Ting, Chang, Kuo-Pin, Hsiao, Yi-Hsuan, Hsieh, Chih-Chang, Chen, Shih-Hung, Shih, Yen-Hao, Hsieh, Kuang-Yeu, Yang, Tahone, Chen, Kuang-Chao, Lu, Chih-Yuan

Year:

2012

Language:

english

File:

PDF, 1.23 MB

english, 2012

28

Field effect of in-plane gates with different gap sizes on the Fermi level tuning of graphene channels

Lin, Meng-Yu, Chen, Yen-Hao, Wang, Cheng-Hung, Su, Chen-Fung, Chang, Shu-Wei, Lee, Si-Chen, Lin, Shih-Yen

Journal:

Applied Physics Letters

Year:

2014

Language:

english

File:

PDF, 1002 KB

english, 2014

29

[IEEE 2014 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA) - Hsinchu, Taiwan (2014.4.28-2014.4.30)] Proceedings of Technical Program - 2014 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA) - Study of the programming sequence induced back-pattern effect in split-page 3D vertical-gate (VG) NAND flash

Wei-Chen Chen,, Lue, Hang-Ting, Kuo-Pin Chang,, Yi-Hsuan Hsiao,, Hsieh, Chih-Chang, Yen-Hao Shih,, Chih-Yuan Lu,

Year:

2014

Language:

english

File:

PDF, 611 KB

english, 2014

30

Fermi-level shifts in graphene transistors with dual-cut channels scraped by atomic force microscope tips

Lin, Meng-Yu, Chen, Yen-Hao, Su, Chen-Fung, Chang, Shu-Wei, Lee, Si-Chen, Lin, Shih-Yen

Journal:

Applied Physics Letters

Year:

2014

Language:

english

File:

PDF, 773 KB

english, 2014

31

[IEEE 2014 IEEE Symposium on VLSI Technology - Honolulu, HI, USA (2014.6.9-2014.6.12)] 2014 Symposium on VLSI Technology (VLSI-Technology): Digest of Technical Papers - A novel capacitive-coupled floating gate antenna protection design and its application to prevent in-process charging effects for 3D NAND flash memory

Lue, Hang-Ting, Ten-Hao Yeh,, Kuo-Ping Chang,, Tzu-Hsuan Hsu,, Yen-Hao Shih,, Chih-Yuan Lu,

Year:

2014

Language:

english

File:

PDF, 860 KB

english, 2014

32

Distribution of nanoscale nuclei in the amorphous dome of a phase change random access memory

Lee, Bong-Sub, Darmawikarta, Kristof, Raoux, Simone, Shih, Yen-Hao, Zhu, Yu, Bishop, Stephen G., Abelson, John R.

Journal:

Applied Physics Letters

Year:

2014

Language:

english

File:

PDF, 1.24 MB

english, 2014

33

[IEEE 2013 5th IEEE International Memory Workshop (IMW) - Monterey, CA, USA (2013.05.26-2013.05.29)] 2013 5th IEEE International Memory Workshop - Increasing VG-type 3D NAND flash cell density by using ultra-thin poly-silicon channels

Yeh, Teng-Hao, Du, Pei-Ying, Hsu, Tzu-Hsuan, Chen, Wei-Chen, Lue, Hang-Ting, Shih, Yen-Hao, Huang, Yu-De, Hsu, Han-Hui, Lin, Lo-Yueh, King, Ya-Chin, Yang, Tahone, Lu, Chih-Yuan

Year:

2013

Language:

english

File:

PDF, 1.28 MB

english, 2013

34

[IEEE IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. - Tempe, Arizon, USA (Dec. 5, 2005)] IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. - Highly reliable 2-bit/cell nitride trapping flash memory using a novel array-nitride-sealing (ANS) ONO process

Yen-Hao Shih,, Lee, S.C., Lue, H.T., Wu, M.D., Hsu, T.H., Lai, E.K., Hsieh, J.Y., Wu, C.W., Yang, L.W., Kuang Yeu Hsieh,, Chen, K.C., Liu, R., Chih-Yuan Lu,

Year:

2005

Language:

english

File:

PDF, 736 KB

english, 2005

35

[IEEE IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. - Tempe, Arizon, USA (Dec. 5, 2005)] IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. - BE-SONOS: A bandgap engineered SONOS with excellent performance and reliability

Hang-Ting Lue,, Szu-Yu Wang,, Erh-Kun Lai,, Yen-Hao Shih,, Sheng-Chih Lai,, Ling-Wu Yang,, Kuang-Chao Chen,, Ku, J., Kuang-Yeu Hsieh,, Liu, R., Chih-Yuan Lu,

Year:

2005

Language:

english

File:

PDF, 393 KB

english, 2005

36

[IEEE 2014 IEEE Symposium on VLSI Technology - Honolulu, HI, USA (2014.6.9-2014.6.12)] 2014 Symposium on VLSI Technology (VLSI-Technology): Digest of Technical Papers - Study of the impact of charge-neutrality level (CNL) of grain boundary interface trap on device variability and P/E cycling endurance of 3D NAND flash memory

Chen, Wei-Chen, Lue, Hang-Ting, Hsiao, Yi-Hsuan, Lin, Xi-Wei, Huang, Jacky, Shih, Yen-Hao, Lu, Chih-Yuan

Year:

2014

Language:

english

File:

PDF, 6.02 MB

english, 2014

37

[IEEE 2014 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2014.12.15-2014.12.17)] 2014 IEEE International Electron Devices Meeting - A novel double-trapping BE-SONOS charge-trapping NAND flash device to overcome the erase saturation without using curvature-induced field enhancement effect or high-K (HK)/metal gate (MG) materials

Lue, Hang-Ting, Roger Lo,, Chih-Chang Hsieh,, Pei-Ying Du,, Chen, Chih-Ping, Tzu-Hsuan Hsu,, Kuo-Ping Chang,, Yen-Hao Shih,, Chih-Yuan Lu,

Year:

2014

Language:

english

File:

PDF, 1.14 MB

english, 2014

38

[IEEE 2014 IEEE 12th International Conference on Solid -State and Integrated Circuit Technology (ICSICT) - Guilin, China (2014.10.28-2014.10.31)] 2014 12th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) - Overview of 3D NAND Flash and progress of split-page 3D vertical gate (3DVG) NAND architecture

Du, Pei-Ying, Lue, Hang-Ting, Shih, Yen-Hao, Hsieh, Kuang-Yeu, Lu, Chih-Yuan

Year:

2014

Language:

english

File:

PDF, 2.73 MB

english, 2014

39

Layer-Aware Program-and-Read Schemes for 3D Stackable Vertical-Gate BE-SONOS NAND Flash Against Cross-Layer Process Variations

Hung, Chun-Hsiung, Chang, Meng-Fan, Yang, Yih-Shan, Kuo, Yao-Jen, Lai, Tzu-Neng, Shen, Shin-Jang, Hsu, Jo-Yu, Hung, Shuo-Nan, Lue, Hang-Ting, Shih, Yen-Hao, Huang, Shih-Lin, Chen, Ti-Wen, Chen, Tzung

Journal:

IEEE Journal of Solid-State Circuits

Year:

2015

Language:

english

File:

PDF, 3.11 MB

english, 2015

40

SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, CA (Sunday 2 August 2009)] Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XI - Far-IR reflectance spectra analysis of CdZnTe and related materials

Yang, Tzuen-Rong, Jhang, Sheng-Hong, Shih, Yen-Hao, Hou, Fu-Chung, Yang, Yu-Chang, Becla, P., Tien, Der-Chi, Feng, Zhe Chuan, James, Ralph B., Franks, Larry A., Burger, Arnold

Year:

2009

Language:

english

File:

PDF, 635 KB

english, 2009

41

[IEEE 2015 IEEE International Memory Workshop (IMW) - Monterey, CA, USA (2015.5.17-2015.5.20)] 2015 IEEE International Memory Workshop (IMW) - A Study of Blocking and Tunnel Oxide Engineering on Double-Trapping (DT) BE-SONOS Performance

Lo, Roger, Du, Pei-Ying, Hsu, Tzu-Hsuan, Wu, Chen-Jun, Guo, Jung-Yi, Cheng, Chun-Min, Lue, Hang-Ting, Shih, Yen-Hao, Hou, Tuo-Hung, Hsieh, Kuang-Yeu, Lu, Chih-Yuan

Year:

2015

Language:

english

File:

PDF, 441 KB

english, 2015

42

Treatment Outcomes of Patients with Locally Advanced Synchronous Esophageal and Head/Neck Squamous Cell Carcinoma Receiving Curative Concurrent Chemoradiotherapy

Chen, Yen-Hao, Lu, Hung-I., Chien, Chih-Yen, Lo, Chien-Ming, Wang, Yu-Ming, Chou, Shang-Yu, Su, Yan-Ye, Shih, Li-Hsueh, Li, Shau-Hsuan

Journal:

Scientific Reports

Year:

2017

Language:

english

File:

PDF, 469 KB

english, 2017

43

[IEEE 2016 9th International Congress on Image and Signal Processing, BioMedical Engineering and Informatics (CISP-BMEI) - Datong, China (2016.10.15-2016.10.17)] 2016 9th International Congress on Image and Signal Processing, BioMedical Engineering and Informatics (CISP-BMEI) - Design and implement SPEEX decoder on ARM processor

Chang, Chia-Chi, Shih, Yen-Hao, Wang, Po-Min

Year:

2016

Language:

english

File:

PDF, 969 KB

english, 2016

44

[IEEE 2017 Joint International Symposium on e-Manufacturing and Design Collaboration (eMDC) & Semiconductor Manufacturing (ISSM) - Hsinchu, Taiwan (2017.9.15-2017.9.15)] 2017 Joint International Symposium on e-Manufacturing and Design Collaboration (eMDC) & Semiconductor Manufacturing (ISSM) - A promising solution to reduce plasma induced damage (PID) of high density plasma (HDP) oxide without sacrificing the gap-fill and throughput performance — Chin-Tsan Yeh

Yu, Chia-Sheng, Chen, Ying-Tso, Shih, Yen-Hao, Lu, Chih-Yuan

Year:

2017

Language:

english

File:

PDF, 472 KB

english, 2017

45

The crucial role of blood VEGF kinetics in patients with locally advanced esophageal squamous cell carcinoma receiving curative concurrent chemoradiotherapy

Chen, Yen-Hao, Lu, Hung-I, Lo, Chien-Ming, Wang, Yu-Ming, Chou, Shang-Yu, Hsiao, Chang-Chun, Huang, Chao-Cheng, Shih, Li-Hsueh, Chen, Su-Wei, Li, Shau-Hsuan

Journal:

Year:

2018

File:

PDF, 721 KB

2018

46

The clinical impact of supraclavicular lymph node metastasis in patients with locally advanced esophageal squamous cell carcinoma receiving curative concurrent chemoradiotherapy

Chen, Yen-Hao, Lu, Hung-I, Lo, Chien-Ming, Wang, Yu-Ming, Chou, Shang-Yu, Huang, Cheng-Hua, Shih, Li-Hsueh, Chen, Su-Wei, Li, Shau-Hsuan, Coppola, Domenico

Journal:

Year:

2018

Language:

english

File:

PDF, 2.70 MB

english, 2018

47

The crucial role of blood VEGF kinetics in patients with locally advanced esophageal squamous cell carcinoma receiving curative concurrent chemoradiotherapy

Chen, Yen-Hao, Lu, Hung-I, Lo, Chien-Ming, Wang, Yu-Ming, Chou, Shang-Yu, Hsiao, Chang-Chun, Huang, Chao-Cheng, Shih, Li-Hsueh, Chen, Su-Wei, Li, Shau-Hsuan

Journal:

Year:

2018

Language:

english

File:

PDF, 721 KB

english, 2018

48

Disk-based enzyme-linked immunosorbent assays using the liquid-aliquoting and siphoning-evacuation technique

Wu, Ho-Chin, Chen, Yen-Hao, Shih, Chih-Hsin

Journal:

Biomicrofluidics

Year:

2018

Language:

english

File:

PDF, 1.55 MB

english, 2018

49

Validating Risk Prediction Models of Diabetes Remission After Sleeve Gastrectomy

Shen, Shih-Chiang, Wang, Weu, Tam, Ka-Wai, Chen, Hsin-An, Lin, Yen-Kuang, Wang, Shih-Yun, Huang, Ming-Te, Su, Yen-Hao

Journal:

Obesity Surgery

Year:

2018

Language:

english

File:

PDF, 1.06 MB

english, 2018

50

Neck Lymph Node Metastasis as A Poor Prognostic Factor in Thoracic Esophageal Squamous Cell Carcinoma Patients Receiving Concurrent Chemoradiotherapy: A Propensity Score-Matched Analysis

Chen, Yen-Hao, Lu, Hung-I, Lo, Chien-Ming, Wang, Yu-Ming, Chou, Shang-Yu, Hsiao, Chang-Chun, Shih, Li-Hsueh, Chen, Su-Wei, Li, Shau-Hsuan

Journal:

Scientific Reports

Year:

2018

Language:

english

File:

PDF, 1.15 MB

english, 2018